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Reliability Engineering Theory and Practice /
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Birolini, Alessandro
Published 2010
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Reliability Physics and Engineering Time-To-Failure Modeling /
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McPherson, J.W
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Reliability Engineering Theory and Practice /
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Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes /
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Bias Temperature Instability for Devices and Circuits
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Reliability Physics and Engineering Time-To-Failure Modeling /
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